Search results for "Surface-extended X-ray absorption fine structure"
showing 4 items of 4 documents
Interpretation of the Ni K-edge EXAFS in nanocrystalline nickel oxide using molecular dynamics simulations
2011
Abstract Analysis of atomic structure at the nanoscale is a challenging task, complicated by relaxation phenomena and thermal disorder. In this work, the x-ray absorption spectroscopy at the Ni K-edge was used to address this problem in nanocrystalline NiO (nano-NiO) at 300 K. The analysis of the first two coordination shells using conventional two-shell single-scattering approximation allowed us to determine the expansion of the average lattice but contraction of the Ni―O bonds in the first coordination shell in nano-NiO in comparison with the bulk nickel oxide. The EXAFS signal generated within the first six coordination shells (up to ~ 6.5 A) was successfully interpreted using classical …
Extended X-Ray Absorption Fine Structure Spectroscopy of Perovskite-Type Compounds
2000
Application of the extended x-ray absorption fine structure (EXAFS) spectroscopy to a study of the local atomic structure in perovskitetype materials is discussed on the example of several compounds (m-WO3, NaxWO3, ReO3 and FeF3). The sensitivity of the EXAFS to the out-of-center and rotational distortions is discussed in details.
Analysis of extended x-ray absorption fine structure data from copper tungstate by the reverse Monte Carlo method
2014
The static disorder and lattice dynamics of crystalline materials can be efficiently studied using reverse Monte Carlo simulations of extended x-ray absorption fine structure spectra (EXAFS). In this work we demonstrate the potentiality of this method on an example of copper tungstate CuWO4. The simultaneous analysis of the Cu K and W L3 edges EXAFS spectra allowed us to follow local structure distortion as a function of temperature.
Single crystal EXAFS at high pressure
2000
Abstract We present a new technique for structure characterization under high pressure conditions. The use of an undulator beam of the third-generation ESRF source of synchrotron radiation has enabled the first single crystal EXAFS experiments at high pressure using a diamond anvil cell as pressure generator. Taking advantage of the linear polarization of X-rays the technique becomes an orientation-selective probe of the local structure of materials. We describe the principle of the technique and some applications.